GaAs/Al0.8Ga0.2As separate absorption and multiplication region x-ray spectroscopic avalanche photodiodes
- Submitting institution
-
University of Sussex
- Unit of assessment
- 12 - Engineering
- Output identifier
- 328261_92213
- Type
- D - Journal article
- DOI
-
10.1063/5.0009830
- Title of journal
- Journal of Applied Physics
- Article number
- a015704
- First page
- -
- Volume
- 128
- Issue
- 1
- ISSN
- 0021-8979
- Open access status
- Compliant
- Month of publication
- July
- Year of publication
- 2020
- URL
-
https://doi.org/10.1063/5.0009830
- Supplementary information
-
-
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
-
3
- Research group(s)
-
-
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- From the 1980s, debate raged about whether it was possible to create APD detectors which would improve the energy resolution of photon counting X-ray spectrometers. Many researchers thought it was impossible because of avalanche “excess noise”. Reports were made of spectroscopic X-ray APDs over years, but none included unequivocal proof that APDs result in better energy resolution than otherwise identical devices without avalanche layers: no comparisons were made between detectors which were identical except for the addition of an avalanche layer. Here, for the first time, that comparison was made, and it was unequivocally proven that APDs improve energy resolution.
- Author contribution statement
- -
- Non-English
- No
- English abstract
- -
