Compact electrothermal reliability modeling and experimental characterization of bipolar latchup in SiC and CoolMOS power MOSFETs
- Submitting institution
-
The University of Warwick
- Unit of assessment
- 12 - Engineering
- Output identifier
- 8528
- Type
- D - Journal article
- DOI
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10.1109/TPEL.2015.2388512
- Title of journal
- IEEE Transactions on Power Electronics
- Article number
- -
- First page
- 6978
- Volume
- 30
- Issue
- 12
- ISSN
- 0885-8993
- Open access status
- Out of scope for open access requirements
- Month of publication
- December
- Year of publication
- 2015
- URL
-
-
- Supplementary information
-
-
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
-
6
- Research group(s)
-
-
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- The output of this research is a new model for assessing the robustness of SiC power semiconductor devices in critical conditions. This has attracted the attention of several companies developing motor drives for electric vehicles. As a result, the authors have been invited to provide consultancy to US companies Tesla (Alan Tepe, Manager in Power Electronics, alantepe@tesla.com) and Quantentech (Harry Mao, MD, hcmao@quantentech.com), and UK-China company Dynex (CRRC) (Paul Taylor, Chief Consultant, Paul.Taylor@dynexsemi.com).
- Author contribution statement
- -
- Non-English
- No
- English abstract
- -
