Aging Benefits in Nanometer CMOS Designs
- Submitting institution
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King's College London
- Unit of assessment
- 12 - Engineering
- Output identifier
- 139467156
- Type
- D - Journal article
- DOI
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10.1109/TCSII.2016.2561206
- Title of journal
- IEEE Transactions on Circuits and Systems II: Express Briefs
- Article number
- 7463508
- First page
- 324
- Volume
- 64
- Issue
- 3
- ISSN
- 1549-7747
- Open access status
- Out of scope for open access requirements
- Month of publication
- March
- Year of publication
- 2016
- URL
-
-
- Supplementary information
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-
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
-
4
- Research group(s)
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-
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- This paper is the first to identify and demonstrate theoretically and experimentally that ageing of CMOS transistors has benefits of reduced power consumption and improved reliability. This work is significant because until this paper was published, all reported publications highlighted the detrimental effects of transistors ageing on hardware performance. The significance of this work was highlighted in the prestigious IEEE Spectrum magazine, in the Editor’s Pick, May 2017 (https://spectrum.ieee.org/tech-talk/semiconductors/devices/the-benefits-of-old-age-for-transistors). This work led directly to consultancy from Arm, Cambridge (David Flynn, dflynn@ieee.org)
- Author contribution statement
- -
- Non-English
- No
- English abstract
- -