Parallel Algorithms for Testing Finite State Machines:Generating UIO Sequences
- Submitting institution
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The University of Sheffield
- Unit of assessment
- 11 - Computer Science and Informatics
- Output identifier
- 2606
- Type
- D - Journal article
- DOI
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10.1109/tse.2016.2539964
- Title of journal
- IEEE Transactions on Software Engineering
- Article number
- -
- First page
- 1077
- Volume
- 42
- Issue
- 11
- ISSN
- 0098-5589
- Open access status
- Out of scope for open access requirements
- Month of publication
- March
- Year of publication
- 2016
- URL
-
-
- Supplementary information
-
-
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
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1
- Research group(s)
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H - Testing
- Citation count
- 10
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- Many finite state machine (FSM) based test generation algorithms use UIOs; UIO generation time can affect scalability. The paper introduces the first UIO generation algorithm designed for GPUs. It significantly outperformed the standard UIO generation algorithm on benchmark FSMs and randomly generated FSMs. It generated UIOs from FSMs with over a million states within seconds; the previous approach took 20 minutes with FSMs with only 2048 states. Result allows FSM-based generation algorithms to scale further. Invited to be presented as a journal first paper in A* CORE Ranked ICSE 2017.
- Author contribution statement
- -
- Non-English
- No
- English abstract
- -