A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module
- Submitting institution
-
University of Greenwich
- Unit of assessment
- 12 - Engineering
- Output identifier
- 15457
- Type
- D - Journal article
- DOI
-
10.1016/j.microrel.2015.07.047
- Title of journal
- Microelectronics Reliability
- Article number
- -
- First page
- 2371
- Volume
- 55
- Issue
- 11
- ISSN
- 0026-2714
- Open access status
- Out of scope for open access requirements
- Month of publication
- -
- Year of publication
- 2015
- URL
-
-
- Supplementary information
-
-
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
-
2
- Research group(s)
-
-
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- Funded through the Electronics Manufacturing Research Centre, the work played a significant role in Greenwich being a key player in the EPSRC Centre for Power Electronics where it is leading the cross-theme activity in design tools and modelling) (EP/K034804/1). The output is significant as the developed models are providing our industrial partners with design rules and reliability predictions for new power electronics module designs.
- Author contribution statement
- -
- Non-English
- No
- English abstract
- -
