A new SOLT calibration method for leaky on-wafer measurements using a 10-term error model
- Submitting institution
-
University of Glasgow
- Unit of assessment
- 12 - Engineering
- Output identifier
- 12-00789
- Type
- D - Journal article
- DOI
-
10.1109/TMTT.2018.2832052
- Title of journal
- IEEE Transactions on Microwave Theory and Techniques
- Article number
- -
- First page
- 3894
- Volume
- 66
- Issue
- 8
- ISSN
- 0018-9480
- Open access status
- Compliant
- Month of publication
- August
- Year of publication
- 2018
- URL
-
http://eprints.gla.ac.uk/156945/
- Supplementary information
-
-
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
-
3
- Research group(s)
-
-
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- This output underpinned a patent application (PCT/CN2018/125285) currently being commercialised by Hebei Semiconductor Research Institute, China. The research led to the award at the 2018 Technical Progress of Hebei Province Medal (Award No. 2018JB2035) and a provincial development grant (F2019516009, Natural Science Foundation of Hebei Province). The outcomes from the work also supported the award of European project (EURAMET TEMMT 18SIB09), comprising a 19 industrial and academic partner collaboration seeking to improve confidence in parameters for emerging high frequency communications and electronic technologies.
- Author contribution statement
- -
- Non-English
- No
- English abstract
- -
