High precision detection of change in intermediate range order of amorphous zirconia-doped tantala thin films due to annealing
- Submitting institution
-
University of the West of Scotland
- Unit of assessment
- 9 - Physics
- Output identifier
- 14484459
- Type
- D - Journal article
- DOI
-
10.1103/PhysRevLett.123.045501
- Title of journal
- Physical Review Letters
- Article number
- 045501
- First page
- -
- Volume
- 123
- Issue
- 4
- ISSN
- 0031-9007
- Open access status
- Compliant
- Month of publication
- July
- Year of publication
- 2019
- URL
-
-
- Supplementary information
-
-
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
-
29
- Research group(s)
-
A - Institute for Thin Films, Sensors and Imaging
- Citation count
- 10
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- -
- Author contribution statement
- Birney was responsible for development of the first ECR ion beam process for deposition of amorphous zirconia-tantala thin films. Birney fabricated some of the coatings and contributed data and results to the study. The paper details a study of the local atomic order in amorphous thin film coatings, and relates this to macroscopic performance factors, such as mechanical loss, providing an important path towards enabling the accelerated discovery and development of improved optical coatings. This will be of great interest with respect to a number of demanding optical applications, and particularly within gravitational wave detector research.
- Non-English
- No
- English abstract
- -
