Atomic reconstruction in twisted bilayers of transition metal dichalcogenides
- Submitting institution
-
University of Nottingham, The
- Unit of assessment
- 9 - Physics
- Output identifier
- 4202477
- Type
- D - Journal article
- DOI
-
10.1038/s41565-020-0682-9
- Title of journal
- Nature Nanotechnology
- Article number
- -
- First page
- 592
- Volume
- 15
- Issue
- 7
- ISSN
- 1748-3387
- Open access status
- Compliant
- Month of publication
- May
- Year of publication
- 2020
- URL
-
-
- Supplementary information
-
https://static-content.springer.com/esm/art%3A10.1038%2Fs41565-020-0682-9/MediaObjects/41565_2020_682_MOESM1_ESM.pdf
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
-
19
- Research group(s)
-
D - Experimental Condensed Matter and Nanoscience
- Citation count
- 26
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- -
- Author contribution statement
- Beton worked with co-authors Summerfield and Weston to acquire the conductive atomic force microscopy (cAFM) images which are shown in Fig. 4 and provide evidence of the regular variation of electronic structure within the twisted metal dichalcogenide bilayers. The cAFM protocols were adapted from techniques previously developed by Beton and his research students to acquire high resolution cAFM images of graphene and boron nitride.
- Non-English
- No
- English abstract
- -
