An XPS/UPS study of the surface / near-surface bonding in nuclear grade graphites: A comparison of monatomic and cluster depth-profiling techniques
- Submitting institution
-
The University of Manchester
- Unit of assessment
- 12 - Engineering
- Output identifier
- 175445054
- Type
- D - Journal article
- DOI
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10.1016/j.apsusc.2019.144764
- Title of journal
- Applied Surface Science
- Article number
- 144764
- First page
- -
- Volume
- 508
- Issue
- -
- ISSN
- 0169-4332
- Open access status
- Compliant
- Month of publication
- November
- Year of publication
- 2019
- URL
-
-
- Supplementary information
-
-
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
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3
- Research group(s)
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A - MACE - Mech
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- A collaboration with a World leading manufacturer of X-ray photoelectron spectrometers (XPS) has led to a unique and insightful study into the surfaces of graphitic material, comparing two methods of XPS analysis, traditional monoatomic etching and the more modern cluster etching (https://doi.org/10.1016/j.apsusc.2019.144764). This study demonstrated the advantages of cluster ion etching potentially leading to an increase in sales for the industry collaborator. Additionally, Ultra-violet photoelectron spectroscopy (UPS) was also demonstrated to be very useful for highly sensitive probing of a graphite surface and such work can be utilised by the company for future sales [contact: Applications Specialist, Kratos Analytical].
- Author contribution statement
- -
- Non-English
- No
- English abstract
- -
