Data acquisition and imaging using wavelet transform: a new path for high speed transient force microscopy
- Submitting institution
-
University of Ulster
- Unit of assessment
- 12 - Engineering
- Output identifier
- 89515622
- Type
- D - Journal article
- DOI
-
10.1039/D0NA00531B
- Title of journal
- Nanoscale Advances
- Article number
- -
- First page
- 383
- Volume
- 3
- Issue
- 2
- ISSN
- 2516-0230
- Open access status
- Compliant
- Month of publication
- September
- Year of publication
- 2020
- URL
-
-
- Supplementary information
-
-
- Request cross-referral to
- -
- Output has been delayed by COVID-19
- No
- COVID-19 affected output statement
- -
- Forensic science
- No
- Criminology
- No
- Interdisciplinary
- No
- Number of additional authors
-
5
- Research group(s)
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B - Safewater
- Proposed double-weighted
- No
- Reserve for an output with double weighting
- No
- Additional information
- In this work based on wavelet transform theory, we develop new concept for data acquisition and imaging of scanning probe microscopy-SPM signals. Implementation of this method provides the opportunity to capture both transient and steady-state response of the cantilever signal. Applying this technique leads to capture the images of the main frequencies, harmonics, sub-harmonics and non-integer harmonics of cantilever interaction with the surface of materials without using a lock-in amplifier. This has led to a new generation of SPM concepts involving high-speed transient force microscopy and underpins important Probe Microscopy machine learning based data analysis (EP/V034359/1)
- Author contribution statement
- -
- Non-English
- No
- English abstract
- -